New research demonstrates that novel probe technology based on flexible membranes can replace conventional atomic force microscopy (AFM) cantilevers for applications such as fast topographic imaging, ...

A team of researchers from NYU Abu Dhabi's Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Electrochemical atomic force microscopy (EC-AFM) is a powerful analytical technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with electrochemical ...

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...

Graphene is a zero bandgap semiconductor with high electrical conductivity, making it a potential candidate for advancing the semiconductor industry. It is a highly robust material, with a tensile ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Ten years is ample time for market disruption and adaptation in the Atomic Force Microscope (AFM) industry. Park Systems Corp. (Park) typically delivers a major new platform every decade. The ...

InSight 300 is a fabrication-ready, automated atomic force microscope (AAFM) engineered for dependable and economical inline metrology in high-volume semiconductor production settings. Boasting a ...