The LTM is an electro-dynamic testing machine with a drive based on linear motor technology. Zwick's new, patented drive concept enables the LTM to be used for dynamic, as well as static, materials ...

RAVENNA, Ohio—A close correlation between what happens in laboratory testing and what occurs in the field is a holy grail of sorts for tire and rubber product manufacturers. Rewards include ...

Hysitron nanoDMA III from Bruker is the latest powerful dynamic testing method to perform nanoscale mechanical property measurements. nanoDMA III is fitted with the recently developed CMX control ...

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...

Although failure of material is not the only reason for bridge failures, it is a vital step for choosing the correct materials, the analysis of bridge design, and construction testing. Bridge members ...

Dynamic strain rate testing is a critical methodology for examining how materials respond under rapidly applied loads. This approach enables researchers to quantify mechanical properties such as ...

Adaptive testing in integrated circuits (ICs) has emerged as an innovative strategy to optimise and streamline the evaluation of increasingly complex semiconductor devices. By incorporating machine ...