The VALID SL in-circuit and functional test system is designed for high-channel-count testing in demanding electronics manufacturing environments. Introduces a cable-free architecture with new ...
SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...
Astronics released its next-generation circuit card diagnostic and test system, the PinPoint 3-PXIe (P3-PXIe). Combining more than 30 years of development of the PinPoint Circuit Card diagnostic ...
This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...
Cold functional tests have been completed at the ACP100 small modular reactor demonstration project under construction at the Changjiang site on China's island province of Hainan, China National ...
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