Measures spectral IR total hemispherical reflectance, 2.5-25 microns (most surfaces). Integration of reflectance is used to calculate and display emittance. A unique instrument for easily and quickly ...
A far infrared reflectometer attachment designed for the Thermo-Nicolet line of FTIR spectrometers. As a system, the SPECTRAFIRE and Thermo-Nicolet spectrometer provides a Fourier transform infrared ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback