Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...
At its core, SPM operates on the principle of measuring interactions between a sharp probe and the surface of a material. As the probe scans across the surface, it detects variations in physical ...
In recent decades, there has been an increased desire to miniaturize electronics, which, in turn, has enhanced the demand for nano-electrical characterization methods. It is crucial that an ...