A theme of this month’s column is education. Most of the sites I’ve covered this month have a strong educational component and Principle of Scanning Probe Microscopy is no exception. With content ...
Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...
Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...
Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...
The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories. Cantilevers are located ...