In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...

The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...

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What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

New NE-AFM method measures nuclear stiffness in living cells. It shows cancer nuclei change softness with chromatin and environment, aiding diagnosis and treatment. By employing a technique called ...

Atomic force microscopy (AFM) is a cornerstone technique for nanoscale manipulation, and has applications in nanoparticle assembly, biomolecule handling, semiconductor device manufacturing, etc.