In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...

When thinking of celebrated technological innovations, it is perhaps rare that we consider the role of material scientists: the unsung heroes of advancement. Nonetheless, it is the great work of these ...

The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...